Computer-controlled scanning electron microscopy: A fast and reliable tool for diamond prospecting

Nynke Keulen, Mark T. Hutchison, Dirk Frei

Research output: Contribution to journalArticleResearchpeer-review

8 Citations (Scopus)

Abstract

Computer-controlled scanning electron microscopy is introduced as a faster, reliably and cost-reducing alternative to conventional electron microprobe analyses on kimberlite indicator minerals. The method is based on conventional scanning electron microscopy and energy dispersive X-ray spectrometry, but due to extended counting times, optimised settings and computer-controlled particle recognition valid data can be obtained on a low amount of operator and machine time. A comparison of the results between both methods yields that computer-controlled scanning electron microscopy is able to investigate major and minor element concentrations in indicator minerals with almost the same precision as the electron microprobe.

Original languageEnglish
Pages (from-to)1-5
Number of pages5
JournalJournal of Geochemical Exploration
Volume103
Issue number1
DOIs
Publication statusPublished - Oct 2009

Keywords

  • Analytical technique
  • Computer-controlled SEM
  • Garnet
  • Ilmenite
  • Kimberlite indicator mineral
  • Olivine

Programme Area

  • Programme Area 4: Mineral Resources

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