Analysis of heavy minerals in sediments by computer-controlled scanning electron microscopy (CCSEM): Principles and applications

Nynke Keulen; Dirk Frei; Peter Riisager; Christian Knudsen

Analysis of heavy minerals in sediments by computer-controlled scanning electron microscopy (CCSEM): Principles and applications

Nynke Keulen, Dirk Frei, Peter Riisager, Christian Knudsen

Research output: Chapter in Book/Report/Conference proceeding › Chapter in book › Research › peer-review

Abstract

Computer-controlled scanning electron microscopy (CCSEM) is an automatic particle analysis technique for which a standard model scanning electron microscope (SEM) is used. This automated mineralogy technique combines the
advantages of two SEM functions: energy dispersive X-ray spectrometry (EDX) for chemical measurements and digital image analysis of back-scattered electron (BSE) micrographs. CCSEM analysis of a wide range of geological and non-geological materials has been introduced at the Geological Survey of Denmark and Greenland (GEUS) as a fast and reliable method to determine the chemistry of both individual grains and bulk samples. The chemical analysis is combined with measurements of the two-dimensional size and morphology features of every single grain by advanced image analysis. The CCSEM technique is
an alternative to the mineral liberation analysis (MLA) and QEMSCAN techniques, discussed elsewhere in this volume (Sylvester 2012; Pirrie et al. 2004). Results of the CCSEM analyses at GEUS are stored and visualized in a web-accessible Oracle
database.

Original language	English
Title of host publication	Quantitative mineralogy and microanalysis of sediments and sedimentary rocks
Editors	Paul Sylvester
Publisher	Mineralogical Association of Canada
Chapter	9
Pages	167-184
Number of pages	18
ISBN (Print)	978-0-921294-52-8
Publication status	Published - 2012

Publication series

Series	Mineralogical Association of Canada Short Course Series
Volume	42

Programme Area

Programme Area 4: Mineral Resources

Cite this

Keulen, Nynke ; Frei, Dirk ; Riisager, Peter et al. / Analysis of heavy minerals in sediments by computer-controlled scanning electron microscopy (CCSEM): Principles and applications. Quantitative mineralogy and microanalysis of sediments and sedimentary rocks. editor / Paul Sylvester. Mineralogical Association of Canada, 2012. pp. 167-184 (Mineralogical Association of Canada Short Course Series, Vol. 42).

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title = "Analysis of heavy minerals in sediments by computer-controlled scanning electron microscopy (CCSEM): Principles and applications",

abstract = "Computer-controlled scanning electron microscopy (CCSEM) is an automatic particle analysis technique for which a standard model scanning electron microscope (SEM) is used. This automated mineralogy technique combines the advantages of two SEM functions: energy dispersive X-ray spectrometry (EDX) for chemical measurements and digital image analysis of back-scattered electron (BSE) micrographs. CCSEM analysis of a wide range of geological and non-geological materials has been introduced at the Geological Survey of Denmark and Greenland (GEUS) as a fast and reliable method to determine the chemistry of both individual grains and bulk samples. The chemical analysis is combined with measurements of the two-dimensional size and morphology features of every single grain by advanced image analysis. The CCSEM technique is an alternative to the mineral liberation analysis (MLA) and QEMSCAN techniques, discussed elsewhere in this volume (Sylvester 2012; Pirrie et al. 2004). Results of the CCSEM analyses at GEUS are stored and visualized in a web-accessible Oracle database.",

author = "Nynke Keulen and Dirk Frei and Peter Riisager and Christian Knudsen",

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language = "English",

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series = "Mineralogical Association of Canada Short Course Series",

publisher = "Mineralogical Association of Canada",

pages = "167--184",

editor = "Paul Sylvester",

booktitle = "Quantitative mineralogy and microanalysis of sediments and sedimentary rocks",

address = "Canada",

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Keulen, N, Frei, D, Riisager, P & Knudsen, C 2012, Analysis of heavy minerals in sediments by computer-controlled scanning electron microscopy (CCSEM): Principles and applications. in P Sylvester (ed.), Quantitative mineralogy and microanalysis of sediments and sedimentary rocks. Mineralogical Association of Canada, Mineralogical Association of Canada Short Course Series, vol. 42, pp. 167-184.

Analysis of heavy minerals in sediments by computer-controlled scanning electron microscopy (CCSEM): Principles and applications. / Keulen, Nynke; Frei, Dirk; Riisager, Peter et al.
Quantitative mineralogy and microanalysis of sediments and sedimentary rocks. ed. / Paul Sylvester. Mineralogical Association of Canada, 2012. p. 167-184 (Mineralogical Association of Canada Short Course Series, Vol. 42).

Research output: Chapter in Book/Report/Conference proceeding › Chapter in book › Research › peer-review

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T1 - Analysis of heavy minerals in sediments by computer-controlled scanning electron microscopy (CCSEM): Principles and applications

AU - Keulen, Nynke

AU - Frei, Dirk

AU - Riisager, Peter

AU - Knudsen, Christian

PY - 2012

Y1 - 2012

N2 - Computer-controlled scanning electron microscopy (CCSEM) is an automatic particle analysis technique for which a standard model scanning electron microscope (SEM) is used. This automated mineralogy technique combines the advantages of two SEM functions: energy dispersive X-ray spectrometry (EDX) for chemical measurements and digital image analysis of back-scattered electron (BSE) micrographs. CCSEM analysis of a wide range of geological and non-geological materials has been introduced at the Geological Survey of Denmark and Greenland (GEUS) as a fast and reliable method to determine the chemistry of both individual grains and bulk samples. The chemical analysis is combined with measurements of the two-dimensional size and morphology features of every single grain by advanced image analysis. The CCSEM technique is an alternative to the mineral liberation analysis (MLA) and QEMSCAN techniques, discussed elsewhere in this volume (Sylvester 2012; Pirrie et al. 2004). Results of the CCSEM analyses at GEUS are stored and visualized in a web-accessible Oracle database.

AB - Computer-controlled scanning electron microscopy (CCSEM) is an automatic particle analysis technique for which a standard model scanning electron microscope (SEM) is used. This automated mineralogy technique combines the advantages of two SEM functions: energy dispersive X-ray spectrometry (EDX) for chemical measurements and digital image analysis of back-scattered electron (BSE) micrographs. CCSEM analysis of a wide range of geological and non-geological materials has been introduced at the Geological Survey of Denmark and Greenland (GEUS) as a fast and reliable method to determine the chemistry of both individual grains and bulk samples. The chemical analysis is combined with measurements of the two-dimensional size and morphology features of every single grain by advanced image analysis. The CCSEM technique is an alternative to the mineral liberation analysis (MLA) and QEMSCAN techniques, discussed elsewhere in this volume (Sylvester 2012; Pirrie et al. 2004). Results of the CCSEM analyses at GEUS are stored and visualized in a web-accessible Oracle database.

M3 - Chapter in book

SN - 978-0-921294-52-8

T3 - Mineralogical Association of Canada Short Course Series

SP - 167

EP - 184

BT - Quantitative mineralogy and microanalysis of sediments and sedimentary rocks

A2 - Sylvester, Paul

PB - Mineralogical Association of Canada

ER -

Keulen N, Frei D, Riisager P, Knudsen C. Analysis of heavy minerals in sediments by computer-controlled scanning electron microscopy (CCSEM): Principles and applications. In Sylvester P, editor, Quantitative mineralogy and microanalysis of sediments and sedimentary rocks. Mineralogical Association of Canada. 2012. p. 167-184. (Mineralogical Association of Canada Short Course Series, Vol. 42).

Analysis of heavy minerals in sediments by computer-controlled scanning electron microscopy (CCSEM): Principles and applications

Abstract

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