Computer-controlled scanning electron microscopy: A fast and reliable tool for diamond prospecting

Nynke Keulen, Mark T. Hutchison, Dirk Frei

Publikation: Bidrag til tidsskriftArtikelForskningpeer review

8 Citationer (Scopus)

Abstrakt

Computer-controlled scanning electron microscopy is introduced as a faster, reliably and cost-reducing alternative to conventional electron microprobe analyses on kimberlite indicator minerals. The method is based on conventional scanning electron microscopy and energy dispersive X-ray spectrometry, but due to extended counting times, optimised settings and computer-controlled particle recognition valid data can be obtained on a low amount of operator and machine time. A comparison of the results between both methods yields that computer-controlled scanning electron microscopy is able to investigate major and minor element concentrations in indicator minerals with almost the same precision as the electron microprobe.

OriginalsprogEngelsk
Sider (fra-til)1-5
Antal sider5
TidsskriftJournal of Geochemical Exploration
Vol/bind103
Udgave nummer1
DOI
StatusUdgivet - okt. 2009

Programområde

  • Programområde 4: Mineralske råstoffer

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